Fang Cheng obtained his PhD degree from Hefei University of Technology, China, in 2010 where he performed research on nano measurements. Thereafter, he completed his postdoctoral research at National Taiwan University, Taiwan, and Nanyang Technological University, Singapore, where he gained insights into nano-positioning and surface metrology. Cheng joined the Advanced Remanufacturing and Technology Centre (ARTC), A*STAR, in 2013 as a Development Scientist and is now a Group Manager at ARTC. His research interests are in intelligent surface-defect detection, surface-finish inspection, automated optical inspection and in-line instrumentation.
